The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2024
Filed:
Mar. 08, 2021
Jfe Steel Corporation, Tokyo, JP;
Naoya Kiyokane, Tokyo, JP;
Yoshie Obata, Tokyo, JP;
Shin Ishikawa, Tokyo, JP;
Takako Yamashita, Tokyo, JP;
Takeshi Nishiyama, Tokyo, JP;
JFE Steel Corporation, Tokyo, JP;
Abstract
A photographing condition determining method includes: photographing a part of a metal structure of a metal material subjected to predetermined sample preparation under a predetermined photographing condition; assigning, to pixels corresponding to one or a plurality of predetermined phases of the metal structure, labels of respective phases for a photographed image; calculating one or more feature values for a pixel to which a label of one of the assigned phases; classifying the phases of the metal structure of the image by inputting a calculated feature value to a model, which has been learned in advance using feature values assigned with labels of respective phases as input and labels of the respective phases as output, and acquiring a label of a phase of a pixel corresponding to the input feature value; and determining a photographing condition when other parts of the metal structure are photographed based on a classification result.