The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2024
Filed:
Apr. 24, 2019
Shimadzu Corporation, Kyoto, JP;
Yusuke Tagawa, Kyoto, JP;
Yuki Ishikawa, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
A model estimator () estimates a model function of an analyzing system () based on target observation data and reference observation data. For this estimation, the amount of variation between the model of the target system and that of a reference model is estimated from the target observation data and reference observation data. The model function of the target model is estimated after the observation data are corrected based on the estimated amount of variation. A parameter determiner () calculates an acquisition function based on the mean and covariance of the model function, and determines a parameter value for the next observation, using the acquisition function. A data acquirer () sets the parameter value in the analyzing system () and acquires a corresponding observed value. A loop process with the feedback of the observation data is repeated to determine an optimal parameter value. In the case of a parameter search using a multi-task Bayesian optimization method, the present technique improves the efficiency of the parameter search even if the correlation between the target observation data and reference observation data is low.