The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2024

Filed:

Aug. 31, 2021
Applicant:

Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);

Inventors:

Bijan Sayyarodsari, Austin, TX (US);

Kadir Liano, Pflugerville, TX (US);

Wei Dai, Austin, TX (US);

Assignee:

Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0281 (2013.01); G05B 19/4183 (2013.01); G05B 19/4184 (2013.01); G05B 23/0218 (2013.01); G05B 23/0289 (2013.01); G05B 23/024 (2013.01); G05B 2219/37337 (2013.01);
Abstract

A computer-readable medium may include instructions that may cause a processor to perform operations that may include receiving audio data representative of sound waves generated by industrial devices and extracting features from the audio data. The features may be representative of a portion of the audio data. The operations may also include identifying a subset of the features based on distances between each of the plurality of features in an information space. The information space may include known clusters. The operations may then include determining that the subset of the features corresponds to an unknown cluster in the information space, performing a constrained classification operation based on each feature of the subset of the features to identify a new known cluster for the information space, and modifying operations of the industrial devices based on the new known cluster.


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