The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2024

Filed:

Dec. 10, 2021
Applicant:

Battelle Memorial Institute, Richland, WA (US);

Inventors:

Michael S. Hughes, Richland, WA (US);

Eric G. Gonzalez, Richland, WA (US);

Assignee:

Battelle Memorial Institute, Richland, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 5/22 (2006.01); G08B 13/16 (2006.01); G10L 25/51 (2013.01);
U.S. Cl.
CPC ...
G01S 5/22 (2013.01); G08B 13/1672 (2013.01); G10L 25/51 (2013.01);
Abstract

Waveform emission location determination systems and associated methods are described. According to one aspect, a waveform emission location determination system includes a plurality of detectors configured to receive a waveform emitted by a source and to generate electrical signals corresponding to the waveform, processing circuitry configured to access data corresponding to the electrical signals generated by the detectors, use the data to determine a plurality of spheres, and wherein a surface of each of the spheres contains a location of the source when the waveform was emitted by the source, determine an intersection of the spheres, and use the intersection of the spheres to determine the location of the source when the waveform was emitted by the source.


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