The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2024
Filed:
Dec. 16, 2019
Huazhong University of Science and Technology, Hubei, CN;
Lianbo Guo, Hubei, CN;
Yuyang Ma, Hubei, CN;
Zhenlin Hu, Hubei, CN;
Xiujuan Hu, Hubei, CN;
Weiliang Wang, Hubei, CN;
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY, Hubei, CN;
Abstract
The disclosure discloses a laser opto-ultrasonic dual detection method and device using a pulse laser incident on the surface of a sample to generate plasma and the optical emission and ultrasonic waves are generated, to simultaneously analyze the element compositions, structural defects and residual stress of the sample. The detection system includes an excitation unit, a spectrum detection module, an ultrasonic detection module and an analysis control module. The digital delayer generator is connected to the computer, the high-precision 3D displacement platform is electrically connected to the digital delayer generator. The the pulsed laser is focused on and incident onto the surface of the sample to be tested through modulation of the optical path system to generate plasma, which simultaneously generate optical emission and ultrasonic waves. The ultrasonic detection unit is configured to detect the ultrasonic waves. The spectrum detection unit is configured to detect the plasma emission spectrum.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile