The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2024

Filed:

Aug. 10, 2023
Applicant:

Korea Advanced Institute of Science and Technology, Daejeon, KR;

Inventors:

Jonghwa Shin, Daejeon, KR;

Taeyong Chang, Daejeon, KR;

Joonkyo Jung, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/04 (2006.01); G01J 4/00 (2006.01); G01J 9/02 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G01J 1/0407 (2013.01); G01J 4/00 (2013.01); G01J 9/02 (2013.01); G02B 21/0092 (2013.01);
Abstract

An optical measurement device according to an aspect of the present disclosure includes a universal metasurface on which light is incident, a polarization sensor configured to measure a polarization state of light passing through the universal metasurface, and a controller configured to collect a quantitative differential interference contrast (QDIC) image for the x polarization of incident light that is collected by the polarization sensor, a QDIC image for y polarization, and a quantitative relative phase (QRP) image representing a relative phase difference between the x polarization and y polarization and configured to calculate intensity, a phase or polarization information of the incident light.


Find Patent Forward Citations

Loading…