The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2024
Filed:
Oct. 27, 2020
Denso Wave Incorporated, Chita-gun, JP;
Yusuke Mitani, Chita-gun, JP;
DENSO WAVE INCORPORATED, Aichi-pref., JP;
Abstract
A three-dimensional measurement device measures the three-dimensional shape of an object or information indicating a shape thereof based on event data. A stripe pattern is projected from the projection unit to the object. The object is optically imaged by an imaging unit and an image based on event data is acquired. The event data, which are outputted from the image sensor, include two-dimensional point data that specifies the positions of pixels corresponding to the pixels that had luminance changes responsively to the stripe pattern projected. Based on the event data, an image of the object is obtained. The image sensor outputs positive luminance change event data when brightening luminance changes and negative luminance change event data when darkening luminance changes. The measurement unit obtains luminance information based on a time difference between output of event data of positive luminance changes and output of event data of negative luminance changes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile