The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2024

Filed:

Jun. 04, 2020
Applicant:

Process Metrix, Llc, Pleasanton, CA (US);

Inventor:

Michel P. Bonin, Danville, CA (US);

Assignee:

Process Metrix, LLC, Danville, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/06 (2006.01); G01N 21/954 (2006.01); G01S 7/481 (2006.01);
U.S. Cl.
CPC ...
G01B 11/0625 (2013.01); G01N 21/954 (2013.01); G01S 7/4817 (2013.01);
Abstract

A scanner assembly is provided that is configured to be mounted on a scanner manipulator arm, to be placed in proximity to an opening in a vessel or inserted into an opening in a vessel, and to measure distances from a scanner emitter/sensor within the scanner assembly to a plurality of points on the surface of a refractory lining of the vessel to characterize a concave interior of the vessel in a single scan. A scanner manipulator having the manipulator arm attached to the scanner assembly maintains the scanner assembly in measurement positions. A control system controls the position of the scanner assembly, the orientation of the emitter sensor, and the acquisition, storage, processing and presentation of measurements produced by the emitter/sensor. The field of view obtained from the scanner assembly in a single scan exceeds a hemisphere.


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