The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2024

Filed:

Mar. 29, 2022
Applicant:

United States of America As Represented BY the Secretary of the Navy, San Diego, CA (US);

Inventors:

Brittany E. Lynn, San Diego, CA (US);

Alexandru Hening, San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 18/20 (2006.01); F41H 13/00 (2006.01); F41J 2/00 (2006.01); G01S 7/40 (2006.01); G01S 13/04 (2006.01);
U.S. Cl.
CPC ...
F41J 2/00 (2013.01); F41H 13/005 (2013.01); G01S 7/40 (2013.01); G01S 13/04 (2013.01);
Abstract

A method and system for generating laser induced plasma targets for use as an electromagnetic testbed. A method comprising the steps of propagating an intense laser pulse in a media, dividing the laser pulse into a plurality of lasers, focusing each of the plurality of lasers, directing each of the plurality of lasers into a testbed and rastering a plasma-based array, wherein the array is reflective of incident frequencies. Additionally, a plasma target system comprising: a laser source, a focus lens, a steering system, a plasma-based array, and an interrogation system. The laser source generates a short laser pulse. The focus lens focuses the laser pulse. The steering system directs the laser pulse into a test bed. The plasma-based array serves as a target for the testbed. The interrogation system utilizes an incident frequency for tracking the plasma-based array.


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