The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2024

Filed:

Feb. 13, 2024
Applicant:

Additive Monitoring, Inc., Chicago, IL (US);

Inventor:

Niall O'Dowd, Chicago, IL (US);

Assignee:

Additive Monitoring, Inc., Chicago, IL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/393 (2017.01); G01B 11/25 (2006.01); B33Y 50/00 (2015.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); G01B 11/2504 (2013.01); B33Y 50/00 (2014.12);
Abstract

A system includes an additive manufacturing machine having a reference surface and an object surface, at least one camera device to capture the reference surface, at least one projector device to project at the reference surface, a memory storing computer-readable instructions, and at least one processor to execute the instructions to move the reference surface above or below a highest point the object surface, and move the reference surface downward and obtain a digital fringe projection phasemap of the reference surface using the at least one camera device and the at least one projector device until a whole measurement volume has phasemap data.


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