The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2024
Filed:
Jun. 11, 2020
Applicant:
Heteromerge Gmbh, Dresden, DE;
Inventors:
Assignee:
HETEROMERGE GMBH, Dresden, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/209 (2017.01); B29C 64/135 (2017.01); B29C 64/245 (2017.01); B29C 64/264 (2017.01); B29C 64/336 (2017.01); B29K 105/24 (2006.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01);
U.S. Cl.
CPC ...
B29C 64/135 (2017.08); B29C 64/209 (2017.08); B29C 64/245 (2017.08); B29C 64/264 (2017.08); B29C 64/336 (2017.08); B29K 2105/24 (2013.01); B29K 2995/0094 (2013.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12);
Abstract
The invention relates to a device and its use for multiphoton printing for the additive manufacture of three-dimensional structures or for the inspection of these and other structures of comparable size ratios in the presence of an inspection medium. In order to manufacture and inspect three-dimensional structures that have varying properties and/or material compositions, the device according to the invention is characterized by a locally selective material feed (), a locally selective material discharge () and locally selective, focused emission or reception of electromagnetic radiation.