The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2024

Filed:

Nov. 07, 2018
Applicant:

Renishaw Plc, Wotton-under-Edge, GB;

Inventors:

John Dardis, Stroud, GB;

Kiera Megan Jones, Stroud, GB;

Ceri Brown, Plaisance-du-Touch, FR;

Nicholas Henry Hannaford Jones, Stroud, GB;

Assignee:

RENISHAW PLC, Wotton-under-Edge, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 15/00 (2006.01); B22F 10/28 (2021.01); B22F 10/36 (2021.01); B22F 10/366 (2021.01); B22F 12/41 (2021.01); B22F 12/44 (2021.01); B22F 12/49 (2021.01); B22F 12/90 (2021.01); B23K 26/342 (2014.01); B33Y 10/00 (2015.01); B33Y 50/00 (2015.01);
U.S. Cl.
CPC ...
B23K 15/0086 (2013.01); B22F 10/28 (2021.01); B22F 10/36 (2021.01); B22F 10/366 (2021.01); B22F 12/90 (2021.01); B23K 26/342 (2015.10); B33Y 10/00 (2014.12); B33Y 50/00 (2014.12); B22F 12/41 (2021.01); B22F 12/44 (2021.01); B22F 12/49 (2021.01);
Abstract

A method of generating a spatial map of sensor data collected during additive manufacturing, in which a plurality of layers of powder are selectively melted with an energy beam to form an object. The method includes receiving sensor data collected during additive manufacturing of an object, the sensor data including sensor values, the sensor values captured for different coordinate locations of the energy beam during the additive manufacturing of the object, and generating cell values for a corresponding cell-based spatial mapping of the sensor data. Each of the cell values is determined from a respective plurality of the sensor values extending over an area/volume comparable to an extent of the melt pool or the energy beam spot.


Find Patent Forward Citations

Loading…