The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2024

Filed:

Apr. 14, 2022
Applicant:

Canon Medical Systems Corporation, Tochigi, JP;

Inventors:

Xiaohui Zhan, Vernon Hills, IL (US);

Xiaofeng Niu, Vernon Hills, IL (US);

Ruoqiao Zhang, Vernon Hills, IL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/58 (2024.01); A61B 6/03 (2006.01); A61B 6/42 (2024.01); G01T 7/00 (2006.01); G06T 7/00 (2017.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/585 (2013.01); A61B 6/032 (2013.01); A61B 6/4241 (2013.01); G01T 7/005 (2013.01); G06T 7/0012 (2013.01); G06T 11/005 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/30004 (2013.01); G06T 2207/30168 (2013.01);
Abstract

A photon counting computed tomography (CT) method including receiving a first forward model including a set of first parameters and a set of second parameters corresponding to a plurality of materials and path lengths by scanning a slab at plural tube voltages and plural tube currents of an X-ray tube; evaluating an image quality of a material decomposition image reconstructed by the set of first parameters and the set of second parameters; and updating at least one second parameters from the set of second parameters if the image quality of the material decomposition image does not satisfy a predetermined threshold, wherein the updating is achieved by updating the at least one second parameter from the set of second parameters to an energy dependent parameter from a constant value.


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