The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2024
Filed:
Feb. 19, 2019
Integral Scopes Pty Ltd, Brisbane, AU;
INTEGRAL SCOPES PTY LTD, Red Hill Qld, AU;
Abstract
A method of calibration for a plenoptic camera system to determine the true size of an object feature in a light-field image of the object wherein the camera system comprises: an objective lens positioned along an imaging axis intersecting a point in the object; a photosensor positioned for acquiring images of portions of the object and a microlens array positioned in between the objective lens and the photosensor such that each microlens in the array projects a different view of the image formed at the image plane thereby forming an array of elemental images on the photosensor, the method comprising: acquiring an initial image of the object; extracting matching features from any plurality of views derived from a plurality of elemental images forming the initial image; and calculating at least one functional relationship between two or more views having matching features.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile