The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2024

Filed:

Nov. 13, 2020
Applicant:

Deere & Company, Moline, IL (US);

Inventors:

Bryan E. Dugas, Napoleonville, LA (US);

John A. Dighton, Thibodaux, LA (US);

Peter A. Johnson, Thibodaux, LA (US);

Assignee:

DEERE & COMPANY, Moline, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A01D 34/00 (2006.01); A01D 45/10 (2006.01); G01B 11/25 (2006.01); G01S 17/89 (2020.01); G06F 18/24 (2023.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
A01D 34/006 (2013.01); A01D 45/10 (2013.01); G06F 18/24 (2023.01); G06T 7/0004 (2013.01); G01B 11/25 (2013.01); G01S 17/89 (2013.01); G06T 2207/30164 (2013.01);
Abstract

A harvester including an inlet configured to receive a crop including a stalk, a blade configured to cut the crop into a billet, a sensor configured to detect a three-dimensional appearance of at least a portion of the billet and generate a signal associated with the three-dimensional appearance of the at least a portion of the billet, and a control system having a processor, a memory, and a human-machine interface. The control system is configured to receive the signal from the sensor and programmed to 1) analyze the three-dimensional appearance of the at least a portion of the billet, 2) classify the three-dimensional appearance using an indicator of cut quality and 3) index the indicator of cut quality into the memory.


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