The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2024

Filed:

Nov. 21, 2017
Applicant:

National Institute for Materials Science, Ibaraki, JP;

Inventors:

Kota Shiba, Tsukuba, JP;

Ryo Tamura, Tsukuba, JP;

Gaku Imamura, Tsukuba, JP;

Genki Yoshikawa, Tsukuba, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16C 20/70 (2019.01); G01N 1/00 (2006.01); G01N 1/10 (2006.01); G01N 19/00 (2006.01); G01N 29/02 (2006.01); G06N 20/00 (2019.01); G16C 20/20 (2019.01); G16C 20/50 (2019.01); G16C 20/80 (2019.01); G16C 60/00 (2019.01);
U.S. Cl.
CPC ...
G16C 20/70 (2019.02); G01N 1/00 (2013.01); G01N 19/00 (2013.01); G01N 29/022 (2013.01); G06N 20/00 (2019.01); G16C 20/20 (2019.02); G16C 20/50 (2019.02); G16C 20/80 (2019.02); G01N 2001/1087 (2013.01); G01N 2001/1093 (2013.01); G16C 60/00 (2019.02);
Abstract

The present invention provides a method and a device for estimating a value to be estimated associated with a specimen, by performing machine learning of a relationship between a value of an estimation object and an output corresponding thereto, based on an output from a chemical sensor with regard to a plurality of specimens for which specific values to be estimated are known, and using the result of the mechanical learning to estimate a specific value to be estimated on the basis of an output from the chemical sensor with regard to a given unknown specimen.


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