The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2024

Filed:

Nov. 26, 2021
Applicant:

L&t Technology Services Limited, Chennai, IN;

Inventors:

Madhusudan Singh, Bangalore, IN;

Aritra Ghosh Dastidar, Kolkata, IN;

VV Nirmal Ramesh Rayulu, Hyderabad, IN;

Kaushik Halder, Kolkata, IN;

Ajay Sha, Alipurduar, IN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 40/10 (2020.01); G06F 40/20 (2020.01); G06F 40/205 (2020.01); G06F 40/279 (2020.01); G10L 15/16 (2006.01); G10L 15/18 (2013.01);
U.S. Cl.
CPC ...
G10L 15/1815 (2013.01); G06F 40/10 (2020.01); G06F 40/20 (2020.01); G06F 40/205 (2020.01); G10L 15/16 (2013.01);
Abstract

A method for detecting point anomaly in a text data is disclosed. The method may include tokenizing text input comprising a plurality of text entities into a plurality of tokens, annotating, by the point anomaly detection device, the plurality of tokens, based on one or more annotation parameters. One or more annotation parameters comprise a part-of-speech, a sentiment polarity, a negation statement, and domain rules. The method further includes identifying from one or more annotated tokens, at least one of: one or more anomaly subject tokens, one or more anomaly type tokens, and one or more action type tokens from plurality of tokens. The method further includes generating inferences based on the identified one or more anomaly type tokens, the one or more action type tokens from the plurality of tokens, and the one or more annotation parameters.


Find Patent Forward Citations

Singh, Madhusudan. (2024). System and a method for detecting point anomaly (U.S. Patent No. 12100394). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12100394

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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