The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2024

Filed:

Jul. 09, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Arun Kwangil Iyengar, Yorktown Heights, NY (US);

Jeffrey Owen Kephart, Corlandt Manor, NY (US);

Dhavalkumar C. Patel, White Plains, NY (US);

Dung Tien Phan, Pleasantville, NY (US);

Chandrasekhara K. Reddy, Kinnelon, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2023.01); G06F 18/214 (2023.01); G06F 18/22 (2023.01); G06N 20/20 (2019.01); G06Q 10/04 (2023.01);
U.S. Cl.
CPC ...
G06Q 10/04 (2013.01); G06F 18/214 (2023.01); G06F 18/22 (2023.01); G06N 20/20 (2019.01);
Abstract

Techniques for generating model ensembles are provided. A plurality of models trained to generate predictions at each of a plurality of intervals is received. A respective prediction accuracy of each respective model of the plurality of models is determined for a first interval of the plurality of intervals by processing labeled evaluation data using the respective model. Additionally, a model ensemble specifying one or more of the plurality of models for each of the plurality of intervals is generated, comprising selecting, for the first interval, a first model of the plurality of models based on (i) the respective prediction accuracies and (ii) at least one non-error metric.


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