The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2024
Filed:
May. 03, 2022
Hitachi, Ltd., Tokyo, JP;
Makoto Ichii, Tokyo, JP;
Masumi Kawakami, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
When any one or a combination of a ticket, a source code change history, and a source code is input, a source code analysis apparatus generates information of a factor pattern from the information, and a factor metrics calculation unit calculates factor metrics regarding the factor pattern as measured information regarding the factor pattern. In addition, the QCD measurement value is acquired from the information, the QCD index is calculated based on the QCD measurement value, and the correlation calculation unit calculates a correlation coefficient for a pair of the factor metrics and the QCD index, stores the correlation coefficient in the correlation list, calculates a score for the pair of the factor pattern and the QCD measurement value, and generates the important factor pattern information table in which the score is assigned to the pair of the factor pattern and the QCD measurement value.