The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2024
Filed:
May. 21, 2018
General Electric Company, Schenectady, NY (US);
Weizhong Yan, Clifton Park, NY (US);
Lalit Keshav Mestha, North Colonie, NY (US);
Daniel Francis Holzhauer, Burnt Hills, NY (US);
GE INFRASTRUCTURE TECHNOLOGY LLC, Greenville, SC (US);
Abstract
Heterogeneous monitoring nodes may each generate a series of monitoring node values over time associated with operation of an industrial asset. An offline abnormal state detection model creation computer may receive the series of monitoring node values and perform a feature extraction process using a multi-modal, multi-disciplinary framework to generate an initial set of feature vectors. Then feature dimensionality reduction is performed to generate a selected feature vector subset. The model creation computer may derive digital models through a data-driven machine learning modeling method, based on input/output variables identified by domain experts or by learning from the data. The system may then automatically generate domain level features based on a difference between sensor measurements and digital model output. A decision boundary may then be automatically calculated and output for an abnormal state detection model based on the selected feature vector subset and the plurality of derived generated domain level features.