The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2024

Filed:

Feb. 01, 2023
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Chi Chen, Chengdu, CN;

Changyue Dai, Sichuan, CN;

En Shi, Chengdu, CN;

Hailan Dong, Chengdu, CN;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 11/221 (2013.01); G06F 11/2273 (2013.01);
Abstract

Techniques for storage testing involve: acquiring a first state of a storage system including first input/output (IO) load information; taking a first action based on the first state, the first action causing the first IO load information to be changed to second IO load information; updating the first action to be a reserved action for the first state if it is obtained based on the second IO load information that the storage system reaches a preset condition; and obtaining an action combination of a plurality of IO load information changes based on a plurality of reserved actions corresponding to a plurality of states, wherein the plurality of states include the first state. Accordingly, the most effective load combination change mode for the storage system can be found automatically and more accurately, so as to find more vulnerabilities of the storage system, thereby improving the efficiency of storage system testing.


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