The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2024

Filed:

Mar. 10, 2020
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Takanobu Matsuura, Koka, JP;

Mamoru Egi, Otsu, JP;

Yasushi Ono, Kusatsu, JP;

Assignee:

OMRON CORPORATION, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/042 (2006.01);
U.S. Cl.
CPC ...
G05B 19/0426 (2013.01); G05B 19/0423 (2013.01);
Abstract

A technique facilitates presetting of parameters for controlling a control target including a load device that has machine parameters such as inertia changeable in accordance with its posture or state. A parameter setting support apparatus () for supporting a control apparatus () in control parameter setting includes a first specifier () that specifies evaluation index values indicating control stability or control performance of the control apparatus () based on frequency response characteristics of a control target () in postures of the load device () having maximum inertia and minimum inertia, and a second specifier () that specifies a combined evaluation index value representing an evaluation index value in the posture of the load device () in operation based on the evaluation index values specified, by the first specifier (), in the postures of the load device () having maximum inertia and minimum inertia.


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