The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2024

Filed:

Jun. 01, 2023
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Yuki Nakamura, Kanagawa, JP;

Shuntaro Ibuki, Kanagawa, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/30 (2006.01); G02F 1/1337 (2006.01); G02F 1/1335 (2006.01); H10K 59/80 (2023.01);
U.S. Cl.
CPC ...
G02B 5/3016 (2013.01); G02F 1/133719 (2013.01); C09K 2323/02 (2020.08); C09K 2323/031 (2020.08); G02F 1/133541 (2021.01); H10K 59/8793 (2023.02);
Abstract

An optical laminate includes two optically anisotropic layers, an A-plate and a C-plate, in which the adhesiveness between the layers, the liquid crystal alignment of the C-plate, and the adhesiveness between the A-plate and a pressure-sensitive adhesive, are excellent. The optical laminate includes first and second optically anisotropic layers which are A-plate and C-plate formed of a first and second liquid crystal compound, respectively, and a mixed layer disposed between the layers, including components derived from the first and second liquid crystal compounds, and an optical alignment compound, in which a surface energy of the first optically anisotropic layer on a side opposite to the mixed layer is 25 mN/m or more, and where a component in a depth direction is analyzed with time-of-flight type secondary ion mass spectrometry while irradiating ion beams from a surface of the optical laminate on the first, toward the second, optically anisotropic layer.


Find Patent Forward Citations

Loading…