The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2024

Filed:

Jun. 12, 2023
Applicant:

Gatekeeper Systems, Inc., Foothill Ranch, CA (US);

Inventors:

Scott J. Carter, Seal Beach, CA (US);

Ho Man M. Fong, Irvine, CA (US);

Ryan M. Morrison, Costa Mesa, CA (US);

Narayanan V. Ramanathan, Lake Forest, CA (US);

Assignee:

Gatekeeper Systems, Inc., Foothill Ranch, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01); G01R 33/02 (2006.01); G01R 33/06 (2006.01);
U.S. Cl.
CPC ...
G01R 35/005 (2013.01); G01R 33/0206 (2013.01); G01R 33/063 (2013.01);
Abstract

Examples of systems and methods for calibrating or operating a magnetic sensor for sensor temperature or operating conditions are provided. The magnetic sensor can comprise a dual magnetometer sensor that comprises a first, low-power-consumption magnetometer (e.g., a magneto-inductive magnetometer) and a second higher-power-consumption magnetometer (e.g., a magneto-resistive magnetometer). The second magnetometer can have a lower unit-to-unit variation in temperature calibration parameters and can be used to temperature-correct readings from the first magnetometer. The magnetic sensor can dynamically switch between usage of the first magnetometer and the second magnetometer in order to provide a dynamic sample rate that can depend on conditions within the sensor or external to the sensor.


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