The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2024
Filed:
Jan. 21, 2022
Applicant:
Proterial, Ltd., Tokyo, JP;
Inventors:
Nakao Moritsugu, Tokyo, JP;
Hiroshi Takashima, Tokyo, JP;
Assignee:
PROTERIAL, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/28 (2006.01); C22C 45/02 (2006.01); G01N 3/02 (2006.01); G01N 3/08 (2006.01); G01N 3/42 (2006.01); G01N 19/08 (2006.01); G01N 21/59 (2006.01); G01N 33/20 (2019.01);
U.S. Cl.
CPC ...
G01N 3/28 (2013.01); C22C 45/02 (2013.01); G01N 3/02 (2013.01); G01N 33/20 (2013.01);
Abstract
A new method for evaluating embrittlement of an amorphous alloy ribbon is provided. The method includes: pressing a pressurization member from one side to a plurality of positions of an amorphous alloy ribbon; scattering, in the amorphous alloy ribbon, pressurization portions where the pressurization member is pressed to form indentation; and evaluating embrittlement by the number or distribution of pressurization portions where cracks have occurred.