The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2024
Filed:
Jun. 14, 2021
Jfe Steel Corporation, Tokyo, JP;
Yutaka Matsui, Tokyo, JP;
Takafumi Ozeki, Tokyo, JP;
Kazuki Terada, Tokyo, JP;
Kenji Adachi, Tokyo, JP;
Hiroki Imanaka, Tokyo, JP;
Daichi Izumi, Tokyo, JP;
Junji Shimamura, Tokyo, JP;
JFE STEEL CORPORATION, Tokyo, JP;
Abstract
Provided are: a mechanical property measuring apparatus and method that can accurately measure a mechanical property through physical quantities; a substance manufacturing equipment and method that can improve the production yield rate and high-quality substance. A mechanical property measuring apparatus () comprises: a physical quantity measuring unit () configured to measure a plurality of physical quantities of a measured object that includes a substance and a film on a surface of the substance; a mechanical property calculating unit () configured to calculate, using a plurality of calculation models each for calculating a mechanical property of the substance and at least two of the plurality of physical quantities measured, the mechanical property of the substance for each of the plurality of calculation models; and a selection processing unit () configured to select one mechanical property based on the at least two of the plurality of physical quantities.