The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2024
Filed:
Mar. 17, 2021
Sony Group Corporation, Tokyo, JP;
Norihito Mihota, Tokyo, JP;
Sachio Iida, Tokyo, JP;
Sony Group Corporation, Tokyo, JP;
Abstract
An inspection device and method suppressing measurement time and power consumption. A detection device according to the present disclosure includes a first probe with a first antenna unit for transmission, a second probe with a second antenna unit for reception, the second probe being opposed to the first probe at a predetermined distance, a measurement unit that measures a measurement signal including a propagation characteristic of an electromagnetic wave in a medium between the first and second antenna units, and a calculation unit that calculates characteristics information of the medium based on the measurement signal. In a first mode, the measurement unit measures the measurement signal in a first frequency band for the electromagnetic wave propagating in the medium, and in a second mode, the measurement unit measures the measurement signal in a second frequency band, which is a part of the first frequency band for the electromagnetic wave.