The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2024
Filed:
Dec. 07, 2022
Shimadzu Corporation, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
In a defect detection device (), an input receiver () receives an input, by a user, of information concerning the kind and size of a defect expected to be present in or on a test object. An exciter () induces an elastic wave in the test object, with the frequency of the elastic wave being variable. A measurer () optically measures a vibration state of the surface of the test object caused by the elastic wave. A wavelength determiner () determines the wavelength of the elastic wave induced in the test object, based on the vibration state obtained by the measurer. A frequency selector () selects an appropriate frequency from a plurality of frequencies, based on the kind and size of the expected defect as well as the wavelength acquired for each of the plurality of frequencies by the wavelength determiner by varying the frequency of the elastic wave.