The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2024

Filed:

Nov. 25, 2020
Applicant:

Samson Aktiengesellschaft, Frankfurt am Main, DE;

Inventors:

Marcel Krueger, Schoeneck, DE;

Michael Merscher, Roedermark, DE;

Gaetano Richter, Maintal, DE;

Sebastian Krause, Bruchkoebel, DE;

Assignee:

Samson Aktiengesellschaft, Frankfurt am Main, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 1/66 (2022.01); F16K 37/00 (2006.01); G01N 9/00 (2006.01);
U.S. Cl.
CPC ...
G01F 1/662 (2013.01); F16K 37/005 (2013.01); G01N 9/00 (2013.01);
Abstract

In a method for spatially arranging at least one sensor array in a measuring channel, a predetermined desired geometry of the measuring channel is provided; a desired sensor-array arrangement associated with the desired geometry of the measuring channel is provided, where the sensor-array arrangement includes spatially-defined positioning parameters and orienting parameters in regard to the sensor components; an actual geometry of the measuring channel is captured; it is determined if a positioning parameter or an orienting parameter is outside of an admissible value range in relation to the actual geometry of the measuring channel, and the at least two sensor components of the sensor array are arranged in the measuring channel according to a most-current desired-sensor-array arrangement.


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