The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2024
Filed:
Jun. 17, 2019
Omron Corporation, Kyoto, JP;
Lin Miao, Kyoto, JP;
Xingdou Fu, Kyoto, JP;
OMRON CORPORATION, Kyoto, JP;
Abstract
Values of parameters specifying conditions for obtaining 3D measurement data representing a measurement object are output as values satisfying a condition designated by a user. The technique includes setting and changing, within a predetermined range, values of parameters specifying conditions for obtaining 3D measurement data represented by 3D coordinates indicating points on a surface of the measurement object, measuring the measurement object to obtain 3D data sets representing the measurement object based on the parameter values resulting from the setting or the change, registering the 3D data sets, storing an identification result of the measurement object based on 3D data obtained through the registration in association with the parameter values, receiving, from a user, designation of a priority condition for obtaining 3D measurement data, and outputting a combination(s) of values of parameters satisfying the priority condition based on association between identification results of the measurement object and the parameter values.