The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2024
Filed:
Aug. 18, 2022
Skydio, Inc., Redwood City, CA (US);
Peter Henry, San Francisco, CA (US);
Jack Zhu, San Mateo, CA (US);
Brian Richman, San Francisco, CA (US);
Harrison Zheng, Palo Alto, CA (US);
Hayk Martirosyan, San Francisco, CA (US);
Matthew Donahoe, Redwood City, CA (US);
Abraham Galton Bachrach, Emerald Hills, CA (US);
Adam Bry, Redwood City, CA (US);
Skydio, Inc., San Mateo, CA (US);
Abstract
Described herein are systems and methods for structure scan using an unmanned aerial vehicle. For example, some methods include accessing a three-dimensional map of a structure; generating facets based on the three-dimensional map, wherein the facets are respectively a polygon on a plane in three-dimensional space that is fit to a subset of the points in the three-dimensional map; generating a scan plan based on the facets, wherein the scan plan includes a sequence of poses for an unmanned aerial vehicle to assume to enable capture, using image sensors of the unmanned aerial vehicle, of images of the structure; causing the unmanned aerial vehicle to fly to assume a pose corresponding to one of the sequence of poses of the scan plan; and capturing one or more images of the structure from the pose.