The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2024
Filed:
Feb. 24, 2023
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Shigeru Terashima, Utsunomiya, JP;
Takahiro Nakayama, Haga-gun, JP;
Yoichi Matsuoka, Shioya-gun, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03F 7/00 (2006.01); B29C 37/00 (2006.01); B29C 43/56 (2006.01); B29C 59/02 (2006.01); H01L 21/027 (2006.01); B29C 43/34 (2006.01);
U.S. Cl.
CPC ...
B29C 59/026 (2013.01); B29C 37/0053 (2013.01); B29C 43/56 (2013.01); G03F 7/0002 (2013.01); H01L 21/027 (2013.01); B29C 2043/3411 (2013.01);
Abstract
An imprint apparatus that forms a pattern of an imprint material on a substrate with use of a mold includes a mold holding unit configured to hold the mold, a suction unit provided at the mold holding unit and configured to suction a gas in a space in which the mold and the substrate face each other, a detector configured to detect particles included in the gas suctioned by the suction unit, and a control unit configured to perform error processing depending on a result of detection performed by the detector.