The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2024

Filed:

Jul. 22, 2020
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Yohei Okawa, Kyoto, JP;

Kennosuke Hayashi, Kyoto, JP;

Yoshiya Shibata, Kyoto, JP;

Assignee:

OMRON CORPORATION, Kyoto, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); G06N 3/084 (2023.01); G06N 5/04 (2023.01); G06N 3/044 (2023.01);
U.S. Cl.
CPC ...
B25J 9/163 (2013.01); B25J 9/1661 (2013.01); G06N 3/084 (2013.01); G06N 5/04 (2013.01); G05B 2219/40499 (2013.01); G06N 3/044 (2023.01);
Abstract

A model generation apparatus according to one or more embodiments may include: a data obtainer configured to obtain a plurality of learning datasets each including a combination of training data and true data, the training data indicating a positional relationship between two objects, the true data indicating whether the two objects come in contact with each other in the positional relationship; and a machine learning unit configured to train, through machine learning, a determination model using the obtained plurality of learning datasets to cause the determination model to output, in response to an input of training data included in each of the plurality of learning datasets, an output value fitting true data included in a corresponding learning dataset of the plurality of learning datasets.


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