The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2024

Filed:

Mar. 11, 2021
Applicant:

Topcon Corporation, Tokyo, JP;

Inventors:

Tatsuo Yamaguchi, Warabi, JP;

Ryoichi Hirose, Tokyo, JP;

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/00 (2006.01); A61B 3/14 (2006.01); A61B 3/18 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/0025 (2013.01); A61B 3/14 (2013.01); A61B 3/18 (2013.01);
Abstract

In an ophthalmic imaging apparatus of some aspect examples, a data acquiring unit acquires data by applying an OCT scan to an eye. An image constructing unit constructs an image from the data acquired. A focal position changing unit is provided to the measurement arm. A scan controller controls the data acquiring unit according to a scan pattern including first and second partial patterns that are continuous patterns for central and peripheral regions of an OCT scan application area, respectively. A focus controller controls the focal position changing unit such that a first focal position is applied in parallel with an OCT scan of at least part of the first partial pattern and a second focal position is applied in parallel with an OCT scan to at least part of the second partial pattern.


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