The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Jan. 09, 2024
Applicant:

Wuhan Inphilight Technology Company Limited, Wuhan, CN;

Inventors:

Dingbo Xie, Wuhan, CN;

Yongzheng Tang, Wuhan, CN;

Defeng Zhu, Wuhan, CN;

Bo Li, Wuhan, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/03 (2013.01); H04B 10/079 (2013.01);
U.S. Cl.
CPC ...
H04B 10/07957 (2013.01); H04B 10/03 (2013.01); H04B 10/07955 (2013.01);
Abstract

A wavelength debugging method of multi-channel optical module includes: determine the initial temperature of TEC, and plot the temperature-optical power curve of each channel; obtain temperature Tand Tcorresponding to upper and lower limit values of the target wavelength of each channel and the left and right security boundary temperatures T' and T′ of each channel; compare T, T, T′, T′ of each channel, when the product is qualified, record the middle two values in descending order as Tand T, respectively; compare the size of Tand Tof each channel, when the product is qualified, take the maximum value of Tof each channel as T′, and take the minimum value of Tof each channel as T′, the final setting temperature of TEC is calculated as T′=(T′+T′)/2, and the corresponding wavelength for each channel at this temperature T′ is the wavelength after debugging for each channel.


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