The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Jun. 14, 2022
Applicant:

Niterra Co., Ltd., Aichi, JP;

Inventors:

Shoma Tsumagari, Aichi, JP;

Haruki Yoshida, Aichi, JP;

Hiroki Shimada, Aichi, JP;

Tomoya Kukino, Aichi, JP;

Takuto Koba, Aichi, JP;

Noriyuki Tamura, Aichi, JP;

Assignee:

Niterra Co., Ltd., Nagoya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01T 13/38 (2006.01);
U.S. Cl.
CPC ...
H01T 13/38 (2013.01);
Abstract

In a spark plugof the present invention, in a mirror-polished surfaceobtained by mirror-polishing a cut surfaceobtained by cutting an insulatorin a direction perpendicular to an axial line AX direction, at a position separated by 2 mm from a portion having a maximum diameter of a diameter-enlarged portionto a rear end side along the axial line AX direction, when 20 first observation regions X each being 192 μm×255 μm are set so as to each overlap a reference position mbeing a position 0.2 mm in a radial direction from an inner peripheral surfaceside of the insulatorand so as not to overlap each other, a proportion (porosity) of an area of all of pores included in the 20 first observation regions X relative to a total area (100%) of the 20 first observation regions X is not greater than 3.5%, and in a thermally etched surfaceobtained by subjecting the mirror-polished surfaceto thermal etching, when 20 second observation regions Y each being 32 μm×43 μm are set so as to each overlap the reference position mand so as not to overlap each other, a particle size distribution of alumina particles included in the 20 second observation regions Y is regarded as a normal distribution, an average particle diameter of the alumina particles is defined as A, and a standard deviation of a particle diameter of the alumina particles is defined as σ, A is not less than 1.9 μm and not greater than 2.8 μm, and (A+3σ) is not greater than 3.0 μm.


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