The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Apr. 19, 2023
Applicant:

Analog Devices International Unlimited Company, Limerick, IE;

Inventors:

Ahmed I. Khalil, Dracut, MA (US);

Mohamed A. Abdelsalam, Giza, EG;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01Q 3/26 (2006.01); H01Q 3/34 (2006.01); H01Q 21/06 (2006.01); H01Q 21/22 (2006.01); H04B 5/73 (2024.01); H04B 17/12 (2015.01);
U.S. Cl.
CPC ...
H01Q 3/267 (2013.01); H01Q 3/34 (2013.01); H01Q 21/22 (2013.01); H04B 5/73 (2024.01); H04B 17/12 (2015.01); H01Q 21/061 (2013.01);
Abstract

Aspects of this disclosure relate to an array calibration system and method using probes disposed between antenna elements. In certain embodiments, the calibration is performed by measuring near-field relative phase and amplitude measurements of the antenna elements and using such relative measurements to adjust the amplitude and phase of the transceivers connected to the antenna elements. In some embodiments, each antenna element within a set of antenna elements transmits a signal that is received by a single probe, and the received signals are assessed to determine relative phase or amplitude measurements. In some embodiments, a single probe transmits a signal that is received by each antenna element within a set of antenna elements, and the received signals are assessed to determine relative phase and amplitude measurements.


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