The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2024
Filed:
Dec. 12, 2021
Beijing Boe Technology Development Co., Ltd., Beijing, CN;
Boe Technology Group Co., Ltd., Beijing, CN;
Junwei Guo, Beijing, CN;
Zongmin Liu, Beijing, CN;
Xichao Fan, Beijing, CN;
Wei Li, Beijing, CN;
Feng Qu, Beijing, CN;
Beijing BOE Technology Development Co., Ltd., Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
Abstract
A calibration system and a calibration method for a phased-array antenna are provided. The calibration system includes a receiving probe, a parameter tester, an upper computer and a beam controller. The receiving probe may acquire a beam signal, which is radiated by a to-be-tested phased-array antenna according to a provided microwave signal, at a preset position. The parameter tester may generate a test parameter according to the microwave signal and the beam signal. The upper computer may determine whether the to-be-tested phased-array antenna meets a preset index according to the test parameter, and in a case where the to-be-tested phased-array antenna does not meet the preset index, calculate the test parameter according to a genetic algorithm to generate optimized beam control data. The beam controller may generate a control voltage according to the optimized beam control data, and transmit the control voltage to the to-be-tested phased-array antenna.