The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Feb. 22, 2022
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Tao Zhang, Eden Prairie, MN (US);

Jie Ding, Shanghai, CN;

Huili Chen, San Diego, CA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G10L 15/05 (2013.01); G06N 20/20 (2019.01); G10L 15/06 (2013.01);
U.S. Cl.
CPC ...
G10L 15/05 (2013.01); G06N 20/20 (2019.01); G10L 15/063 (2013.01); G10L 2015/0635 (2013.01);
Abstract

A system may create a localized machine learning model including one or more customized local parameter values using a global model and variance data. The localized machine learning model may be used by a device or cohort of devices to perform evaluations of data. The localized model may be trained based off a global model that is adjusted and then trained a certain number of steps, where the number of steps is based at least in part on the variance data. The variance data may include variance data from other device cohorts which is received from a remote device, which can also re-train the global model using the variance data and/or the localized machine learning model(s).


Find Patent Forward Citations

Loading…