The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

May. 13, 2019
Applicant:

Nippon Telegraph and Telephone Corporation, Tokyo, JP;

Inventors:

Taku Sasaki, Musashino, JP;

Keita Mikami, Musashino, JP;

Masashi Toyama, Musashino, JP;

Kunihiro Moriga, Musashino, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 40/10 (2022.01); G06V 10/22 (2022.01); G06V 10/40 (2022.01); G06V 10/778 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 10/778 (2022.01); G06V 10/22 (2022.01); G06V 10/40 (2022.01); G06V 10/82 (2022.01); G06V 40/10 (2022.01);
Abstract

A learning device allocates which feature value of a sub-object is extracted by a module from a group of sub-objects constituting an object of an image to each of modules that extract feature values of the object in the image in a deep neural network that is a learning target. After that, the learning device performs first learning to perform learning of the respective modules so that the respective modules are capable of precisely picking up regions of sub-objects allocated to the modules using information indicating the regions of the sub-objects in an image for each of images and second learning to perform learning of the respective modules so that analysis precision of an image analysis is further improved using a result of the image analysis based on the feature values of the sub-objects picked up by the respective modules.


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