The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2024
Filed:
Aug. 24, 2021
Applicant:
Apple Inc., Cupertino, CA (US);
Inventors:
Chen Huang, Cupertino, CA (US);
Seyed Hesameddin Najafi Shoushtari, San Francisco, CA (US);
Frankie Lu, Campbell, CA (US);
Shih-Yu Sun, Cupertino, CA (US);
Joshua M. Susskind, San Jose, CA (US);
Assignee:
Apple Inc., Cupertino, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/75 (2022.01); G06V 10/34 (2022.01); G06V 10/40 (2022.01);
U.S. Cl.
CPC ...
G06V 10/751 (2022.01); G06V 10/34 (2022.01); G06V 10/40 (2022.01);
Abstract
Feature descriptor matching is reformulated into a graph-matching problem. Keypoints from a query image and a reference image are initially matched and filtered based on the match. For a given keypoint, a feature graph is constructed based on neighboring keypoints surrounding the given keypoint. The feature graph is compared to a corresponding feature graph of a reference image for the matched keypoint. Relocalization data is obtained based on the comparison.