The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2024
Filed:
May. 08, 2019
Nippon Telegraph and Telephone Corporation, Tokyo, JP;
Hitoshi Niigaki, Tokyo, JP;
Yasuhiro Yao, Tokyo, JP;
Masaaki Inoue, Tokyo, JP;
Tomoya Shimizu, Tokyo, JP;
Yukihiro Goto, Tokyo, JP;
Shigehiro Matsuda, Tokyo, JP;
Ryuji Honda, Tokyo, JP;
Hiroyuki Oshida, Tokyo, JP;
Kana Kurata, Tokyo, JP;
Shingo Ando, Tokyo, JP;
Atsushi Sagata, Tokyo, JP;
NIPPON TELEGRAPH AND TELEPHONE CORPORATION, Tokyo, JP;
Abstract
Provided is a point cloud analysis device that curbs a decrease in model estimation accuracy due to a laser measurement point cloud. A clustering unit () clusters a point cloud representing a three-dimensional point on an object obtained by a measurement unit mounted on a moving body and performing measurement while scanning a measurement position, within a scan line, to obtain a point cloud cluster. A central axis direction estimation unit () estimates a central axis direction based on the point cloud cluster. A direction-dependent local effective length estimation unit () estimates a local effective length based on an estimated central axis direction and an interval of scan lines, the local effective length being a length when a length of projection of the point cloud cluster in a central axis direction for each of the point cloud clusters is interpolated by an amount of a loss part of the point cloud.