The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Dec. 21, 2021
Applicant:

Hon Hai Precision Industry Co., Ltd., New Taipei, TW;

Inventors:

Chin-Pin Kuo, New Taipei, TW;

Guo-Chin Sun, New Taipei, TW;

Yueh Chang, New Taipei, TW;

Chung-Yu Wu, New Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/58 (2022.01); G06T 7/174 (2017.01); G06V 10/20 (2022.01);
U.S. Cl.
CPC ...
G06T 7/174 (2017.01); G06V 10/255 (2022.01); G06T 2207/10024 (2013.01); G06T 2207/20081 (2013.01);
Abstract

In a method of distinguishing objects in images, a first image segmentation model is applied to segment a first segmented image including a first object from a test image. A second image segmentation model is applied to segment a second segmented image including a second object from the test image. A third segmented image marking the first object and the second object is obtained according to first coordinates of the first object in the first segmented image and/or second coordinates of the second object in the second segmented image. The method can segment different objects from an image quickly and accurately.


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