The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Feb. 26, 2021
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Kazunori Imoto, Kawasaki, JP;

Tomohiro Nakai, Kawasaki, JP;

Tsukasa Ike, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06F 18/214 (2023.01); G06F 18/241 (2023.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06F 18/214 (2023.01); G06F 18/241 (2023.01); G06N 3/08 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30148 (2013.01);
Abstract

According to one embodiment, a defect management apparatus includes a processor. The processor acquires first information and second information, the first information including first defect positions relating to defects detected with a first device for an inspection target and corresponding first labels indicating classifications of the defects, the second information including second defect positions relating to defects detected with a second device for the inspection target. The processor determines a first defect position corresponding to a second defect position as a corresponding defect position. The processor diverts the first label corresponding to the corresponding defect position as a second label of the second defect position.


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