The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2024
Filed:
Dec. 21, 2021
Applicant:
Dassault Systemes, Vélizy-Villacoublay, FR;
Inventors:
Andreas Weinmann, Munich, DE;
Holger Dammertz, Munich, DE;
Assignee:
Dassault Systems, Vélizy-Villacoublay, FR;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2024.01); G06N 3/04 (2023.01); G06N 3/08 (2023.01); G06T 3/40 (2024.01); G06T 5/50 (2006.01); G06T 5/70 (2024.01);
U.S. Cl.
CPC ...
G06T 5/70 (2024.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06T 3/40 (2013.01); G06T 5/50 (2013.01); G06T 2207/20016 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20224 (2013.01);
Abstract
A computer-implemented method of machine learning including learning a Convolutional Neural Network (CNN) architecture for estimating a degradation generated by a denoiser on a ray traced image. The method includes obtaining a dataset and learning the CNN architecture based on the obtained dataset. The learning including taking as input an image generated by the denoiser and a corresponding noisy image of the provided dataset and outputting an error map. This forms an improved solution with respect to estimating a degradation generated by a denoiser on a ray traced image.