The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Sep. 22, 2020
Applicant:

Vayavision Sensing Ltd., Or Yehuda, IL;

Inventors:

Youval Nehmadi, Nili, IL;

Shahar Ben Ezra, Or Yehuda, IL;

Shmuel Mangan, Nes Ziona, IL;

Mark Wagner, Rehovot, IL;

Anna Cohen, Holon, IL;

Itzik Avital, Hod HaSharon, IL;

Assignee:

Vaya Vision Sensing Ltd., Or Yehuda, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/088 (2023.01); G06V 10/25 (2022.01); G06V 10/764 (2022.01); G06V 10/774 (2022.01); G06V 10/776 (2022.01); G06V 10/82 (2022.01); G06V 20/58 (2022.01);
U.S. Cl.
CPC ...
G06N 3/088 (2013.01); G06V 10/25 (2022.01); G06V 10/764 (2022.01); G06V 10/774 (2022.01); G06V 10/776 (2022.01); G06V 10/82 (2022.01); G06V 20/58 (2022.01);
Abstract

A perception system, comprising a set of reference sensors; a set of test sensors and a computing device, which is configured for receiving first training signals from the set of reference sensors and receiving second training signals from the set of test sensors, the set of reference sensors and the set of test sensors simultaneously exposed to a common scene; processing the first training signals to obtain reference images containing reference depth information associated with the scene; and using the second training signals and the reference images to train a neural network for transforming subsequent test signals from the set of test sensors into test images containing inferred depth information.


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