The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2024
Filed:
Feb. 19, 2024
Sas Institute Inc., Cary, NC (US);
Xinmin Wu, Cary, NC (US);
Ricky Dee Tharrington, Jr., Fuquay-Varina, NC (US);
Ralph Walter Abbey, Cary, NC (US);
Xin Jiang Hunt, Cary, NC (US);
SAS Institute Inc., Cary, NC (US);
Abstract
A computing device trains a fair prediction model while defining an optimal event cutoff value. (A) A prediction model is trained with observation vectors. (B) The prediction model is executed to define a predicted target variable value and a probability associated with an accuracy of the predicted target variable value. (C) A conditional moments matrix is computed based on fairness constraints, the predicted target variable value, and the sensitive attribute variable value of each observation vector. The predicted target variable value has a predefined target event value only when the probability is greater than a predefined event cutoff value. (D) (A) through (C) are repeated. (E) An updated value is computed for the predefined event cutoff value. (F) (A) through (E) are repeated. An optimal event cutoff value is defined from the predefined event cutoff values used when repeating (A) through (E). The optimal value and prediction model are output.