The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2024
Filed:
Oct. 28, 2022
Oracle International Corporation, Redwood Shores, CA (US);
Arno Schneuwly, Effretikon, CH;
Suwen Yang, Belmont, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
A computer trains, based on many timeseries, many anomaly detectors. Each anomaly detector is configured with a respective distinct contamination factor. Each timeseries is a temporal sequence of datapoints that characterize a device. Each datapoint in the many timeseries has a respective label that indicates whether the device failed when the datapoint occurred. Each anomaly detector detects: a set of anomalous datapoints, the size of which is proportional to the contamination factor of the anomaly detector, a healthy count of anomalous datapoints in timeseries of devices not failed, and an unhealthy count of anomalous datapoints in timeseries of failed devices. For a particular anomaly detector, the computer detects that the magnitude of the difference between the respective healthy count and the respective unhealthy count is less than a predefined threshold. Based on the contamination factor of the particular anomaly detector, anomalous datapoints are oversampled. Based on the oversampled anomalous datapoints, a classifier is trained.