The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Aug. 20, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Lin Dong, Beijing, CN;

Chao Xue, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06F 18/214 (2023.01); G06N 20/00 (2019.01); G06V 10/764 (2022.01); G06V 10/776 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06F 18/214 (2023.01); G06N 20/00 (2019.01); G06V 10/764 (2022.01); G06V 10/776 (2022.01); G06V 10/82 (2022.01);
Abstract

A method, system, and computer program product for hyper-parameter determination. In a method, a network architecture of a learning model may be determined, and the learning model may be configured for performing a computing task based on machine learning. A metric value record associated with a group of hyper-parameters may be obtained during hyper-parameter determination for the learning model. An estimation of a metric value may be obtained based on the network architecture, and the metric value record and an association relationship representing an association between network architectures and metric values for the network architectures. The group of hyper-parameters may be selected in response to the estimation of the metric value meeting a predefined criterion. With these embodiments, a group of hyper-parameters may be selected, and further the learning model may be trained based on the selected group of hyper-parameters.


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