The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2024
Filed:
May. 27, 2022
Nanjing University of Posts and Telecommunications, Jiangsu, CN;
Nantong Institute of Nanjing University of Posts and Telecommunications Co., Ltd., Jiangsu, CN;
Zhikuang Cai, Jiangsu, CN;
Hang Yang, Jiangsu, CN;
Zhenghao Zhao, Jiangsu, CN;
Hongqiang Zhu, Jiangsu, CN;
Henglu Wang, Jiangsu, CN;
Jingjing Guo, Jiangsu, CN;
Jiafei Yao, Jiangsu, CN;
Yufeng Guo, Jiangsu, CN;
Abstract
The present disclosure discloses a method for extracting parasitic capacitance of interconnection lines of an integrated circuit based on discontinuous Galerkin finite element method. The method includes: dividing non-uniform rectangular grids according to the distribution situation of conductors; determining whether the rectangular grids are boundary cell grids, and marking global numbers and numbers to be solved in sequence; initializing degree of freedom values of all rectangular grids; traversing all rectangular grids, obtaining a linear system of equations, and computing potential function degrees of freedom of all rectangular grids; obtaining an electric field strength function degree of freedom of each cell according to the potential function degree of freedom of each rectangular grid; and dividing a Gaussian surface of each conductor, performing integration of the determined electric field strength function on the Gaussian surface to obtain electric charge, and finally, obtaining main conductor capacitance and coupling capacitance.